Scanning Probe Microscope

About:

Atomic Force Microscopy (AFM) is a powerful imaging technique used in nanotechnology and materials science. The Core AFM scans a tiny probe over a sample's surface, measuring the forces between the probe and the sample to observe high-resolution topography images.

Salient Features

Various operating modes: Contact mode, Tapping mode, Magnetic force microscopy (MFM), Electrical force microscopy (EFM), Force modulation, Standard and Advanced lithography, and spectroscopy.

Capable of topography image measurement of solid and biological samples.

Mountain SPIP commercial license image analysis software for visualization and analysis of AFM images.

Key Applications

Surface topography

Material properties at the nanoscale

Biological samples

Surface roughness

Electrical property mapping

"Explore the Nanoscale Universe with Core AFM. Unmatched Precision in Surface Imaging and Analysis."