Technical Specifications
Model Name
SU3800 Hi-SEM with EDS and Sputter Coater
Manufacturer
Hitachi High-Tech India Pvt. Ltd.
Scanning Electron Microscope (SEM) with EDS
About:
The Hitachi SU3800 SEM performs high-resolution characterization and analysis, yielding precise nanoscale surface information. It is equipped with advanced optics and detection systems, including SE, BSE, UVD, and STEM detectors. The SEM provides comprehensive information about specimen surface morphology, with an EDS system for elemental composition analysis.
Salient Features
Five-axis motorized stage with a maximum specimen size of 200mm in diameter.
High resolution: 3.0 nm at 30kV (High Vacuum Mode) for SE, and 4.0 nm at 30kV (Low Vacuum Mode) for BSE.
Unique Ultra Variable Pressure Detector (UVD II) for SE imaging and CL imaging.
Oxford Xplore EDS system for live elemental mapping.
Gold sputter coating unit for preparing conducting layers on non-conducting samples.
Key Applications
"Discover the Nanoscale World with SU3800 SEM. High-Resolution Imaging and Elemental Analysis at Your Fingertips."