Technical Specifications
Model Name
D6 PHASER
Manufacturer
Bruker India Scientific Pvt. Ltd.
X-Ray Diffractometer (XRD)
About:
The D6 PHASER X-ray diffractometer is an adaptable instrument designed for analyzing powders, thin films, epitaxial layers, ceramics, and other materials through X-ray diffraction. This technique involves directing main X-rays at the sample substance, where its wave nature causes diffraction at specific angles, providing information on the crystal structure.
Salient Features
XRD measurement with a 1.2KW X-ray tube source.
Accurate XRD pattern measurement with ±0.01° precision.
Various specimen holders for user-defined applications in pharmaceuticals, materials science, life science, and engineering.
Vacuum chuck for tiny thin film samples and wafer testing.
X-Ray Reflectometry (XRR): Measures thickness, density, and roughness of thin films.
Provides high-resolution data for thin film analysis.
Key Applications
"Unlock the Secrets of Crystalline Structures with D6 PHASER. Precision Analysis for Advanced Material Research."